Share Email Print

Journal of Micro/Nanolithography, MEMS, and MOEMS

Uniform tilt-angle micromirror array for multiobject spectroscopy
Author(s): Severin Waldis; Frederic Zamkotsian; Pierre-Andre Clerc; Wilfried Noell; Michael Zickar; Patrick Lanzoni; Nicolaas F. de Rooij
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We report on micromirror arrays being developed for use as reflective slit masks in multiobject spectrographs for astronomical applications. The micromirrors are etched in bulk single crystal silicon, whereas cantilever-type suspension is realized by surface micromachining. One micromirror element is 100×200 μm in size. A system of multiple landing beams is developed, which electrostatically clamps the mirror at a well-defined tilt angle when actuated. The mechanical tilt angle obtained is 20 deg at a pull-in voltage of 90 V. Measurements with an optical profiler show that the tilt angle of the actuated mirror is stable with a precision of one arc minute over a range of 15 V. This electrostatic clamping system provides uniform tilt angle over the whole array: the maximum deviation measured between any two mirrors is as low as one arc minute. The surface quality of the mirrors in the actuated state is better than 10 nm peak-to-valley and the local roughness is around 1-nm rms. Cryogenic testing shows that the micromirror device is functional at temperatures below 100 K.

Paper Details

Date Published: 1 April 2008
PDF: 11 pages
J. Micro/Nanolith. 7(2) 021014 doi: 10.1117/1.2920338
Published in: Journal of Micro/Nanolithography, MEMS, and MOEMS Volume 7, Issue 2
Show Author Affiliations
Severin Waldis, Carl Zeiss AG (Germany)
Frederic Zamkotsian, Lab. d'Astrophysique de Marseille (France)
Pierre-Andre Clerc, Univ. de Neuchâtel (Switzerland)
Wilfried Noell, Univ. de Neuchâtel (Switzerland)
Michael Zickar, Univ. de Neuchâtel (Switzerland)
Patrick Lanzoni, Lab. d'Astrophysique de Marseille (France)
Nicolaas F. de Rooij, Univ. de Neuchâtel (Switzerland)

© SPIE. Terms of Use
Back to Top