Share Email Print
cover

Optical Engineering

Measured and predicted light attenuation in dense coastal upslope fog at 650, 850, and 950 nm for free-space optics applications
Author(s): Maher C. Al Naboulsi; Frederique De Fornel; Hervé Sizun; Michael Gebhart; Erich Leitgeb; S. Sheikh Muhammad; Benno Flecker; Christoph Chlestil
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Abstract

Free-space optics (FSO) has gained considerable importance in this decade of demand for high-bandwidth transmission capabilities. FSO can provide the last mile solution, but the availability and reliability issues concerned with it have received increasing attention and need thorough investigation. In this work, we present our results on fog attenuation measurement and prediction at wavelengths 650, 850, and 950 nm with peak values up to 500 dB/km. For the attenuation measurement, optical wavelengths are transmitted over the same path of fog in free air to a receiver, measuring the power at every wavelength. The measurement of fog attenuation was performed at the France Telecom R&D test facility at La Turbie (in the south of France). We compare our measurement data with the commonly used light attenuation models (Kruse and Kim models) and with a new proposed model allowing the prediction of fog attenuation for the 0.69- to 1.55-μm spectral band. We present some interesting insights and discuss the wavelength dependence. The practical measurements described promise to validate the models and therefore should lead to more accurate availability prediction for FSO links.

Paper Details

Date Published: 1 March 2008
PDF: 14 pages
Opt. Eng. 47(3) 036001 doi: 10.1117/1.2899023
Published in: Optical Engineering Volume 47, Issue 3
Show Author Affiliations
Maher C. Al Naboulsi, Univ. de Bourgogne (France)
Frederique De Fornel, Univ. de Bourgogne (France)
Hervé Sizun, France Télécom (France)
Michael Gebhart, NXP Semiconductors Austria GmbH Styria (Austria)
Erich Leitgeb, Technische Univ. Graz (Austria)
S. Sheikh Muhammad, Technische Univ. Graz (Austria)
Benno Flecker, Technische Univ. Graz (Austria)
Christoph Chlestil, NXP Semiconductors Austria GmbH Styria (Austria)


© SPIE. Terms of Use
Back to Top