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Optical Engineering

All-in-one measurement setup for fast and accurate linear characterization of guided-wave optical devices
Author(s): Davide Castaldini; Paolo Bassi; Sorin Tascu; Greg Sauder; Pierre Aschieri; Marc P. De Micheli; Pascal A. Baldi; Krishna Thyagarajan; Mangalpady R. Shenoy
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Paper Abstract

We present an all-in-one, computer-controlled, measurement setup able to evaluate propagation losses, effective group index, and mode size of integrated optical devices and optical fibers. The possibility to use a single setup, instead of three separate ones, enables faster measurements, improvements in terms of reproducibility and precision, and reduction of systematic errors. Control of the operating conditions, easier system upgrade besides cost and laboratory space savings are other additional features of this system. To confirm proper operation and versatility of the proposed setup, different samples are successfully characterized, and results are presented and discussed.

Paper Details

Date Published: 1 December 2007
PDF: 9 pages
Opt. Eng. 46(12) 124601 doi: 10.1117/1.2821860
Published in: Optical Engineering Volume 46, Issue 12
Show Author Affiliations
Davide Castaldini, Univ. degli Studi di Bologna (Italy)
Paolo Bassi, Univ. degli Studi di Bologna (Italy)
Sorin Tascu, Univ. de Nice Sophia Antipolis (France)
Greg Sauder, Univ. de Nice Sophia Antipolis (France)
Pierre Aschieri, Univ. de Nice Sophia Antipolis (France)
Marc P. De Micheli, Univ. de Nice Sophia Antipolis (France)
Pascal A. Baldi, Univ. de Nice Sophia Antipolis (France)
Krishna Thyagarajan, Indian Institute of Technology Delhi (India)
Mangalpady R. Shenoy, Indian Institute of Technology (India)

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