Share Email Print

Journal of Biomedical Optics

Functional optical signal analysis: a software tool for near-infrared spectroscopy data processing incorporating statistical parametric mapping
Author(s): Peck Hui Koh; Daniel Glaser; Guillaume Flandin; Stefan Kiebel; Brian Butterworth; Atsushi Maki; David T. Delpy; Clare E. Elwell
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Optical topography (OT) relies on the near infrared spectroscopy (NIRS) technique to provide noninvasively a spatial map of functional brain activity. OT has advantages over conventional fMRI in terms of its simple approach to measuring the hemodynamic response, its ability to distinguish between changes in oxy- and deoxy-hemoglobin and the range of human participants that can be readily investigated. We offer a new software tool, functional optical signal analysis (fOSA), for analyzing the spatially resolved optical signals that provides statistical inference capabilities about the distribution of brain activity in space and time and by experimental condition. It does this by mapping the signal into a standard functional neuroimaging analysis software, statistical parametric mapping (SPM), and forms, in effect, a new SPM toolbox specifically designed for NIRS in an OT configuration. The validity of the program has been tested using synthetic data, and its applicability is demonstrated with experimental data.

Paper Details

Date Published: 1 November 2007
PDF: 13 pages
J. Biomed. Opt. 12(6) 064010 doi: 10.1117/1.2804092
Published in: Journal of Biomedical Optics Volume 12, Issue 6
Show Author Affiliations
Peck Hui Koh, Univ. College London (United Kingdom)
Daniel Glaser, Univ. College London (United Kingdom)
Guillaume Flandin, Univ. College London (United Kingdom)
Stefan Kiebel, Univ. College London (United Kingdom)
Brian Butterworth, Univ. College London (United Kingdom)
Atsushi Maki, Hitachi, Ltd. (Japan)
David T. Delpy, Univ. College London (United Kingdom)
Clare E. Elwell, Univ. College London (United Kingdom)

© SPIE. Terms of Use
Back to Top