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Optical Engineering

Metallic surface roughness mapping using a PC-interfaced optoelectronic sensor system
Author(s): Kabilan Ponnusamy Arunachalam; Paulvanna Nayaki Marimuthu
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Paper Abstract

We present the measurement and graphical representation of spatial differential values of the surface roughness factor for various steel samples. The measurements were made by a newly developed optoelectronic sensor system comprising a light emitting diode (LED) and two phototransistors. The light beam from the LED illuminated an area of 1 mm2 on the metallic surface. The reflected light and scattered light were captured by two different photo detectors. The sample surface was scanned using a computer numerical control (CNC) machine. The photocurrent signals acquired at each point on the surface were digitized, and a parameter was calculated to correspond to the degree of roughness of the surface at the given point. The measured roughness factor is compared with the readings of a standard instrument, and the instrument was calibrated to display the measurements in micrometers. The measured values processed by a personal computer provided a three-dimensional (3-D) mapping of the surface texture.

Paper Details

Date Published: 1 October 2007
PDF: 4 pages
Opt. Eng. 46(10) 103602 doi: 10.1117/1.2799078
Published in: Optical Engineering Volume 46, Issue 10
Show Author Affiliations
Kabilan Ponnusamy Arunachalam, Bannari Amman Institute of Technology (India)
Paulvanna Nayaki Marimuthu, P.S.N.A. College of Engineering & Technology (India)

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