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Optical Engineering

Group-index birefringence and loss measurements in silicon-on-insulator photonic wire waveguides
Author(s): David Duchense; Pavel Cheben; Roberto A. Morandotti; Boris Lamontagne; Dan-Xia Xu; Siegfried Janz; Demetrios N. Christodoulides
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Paper Abstract

Group-index birefringence in silicon-on-insulator photonic wire waveguides is determined through a polarization beating technique and a Fabry-Pérot resonance method. A large group-index birefringence, up to 0.67, is obtained as a result of the structural asymmetry and high field confinement of our waveguides. The group index and linear propagation loss are also determined. In particular, the group index is found to be as large as 4.45 due to the significant change in the effective mode index of the waveguide as a function of the wavelength. The effects of structure size on the measured losses and group indices are analyzed. Our experimental results are in good agreement with our simulations, and the method employed is found to be effective in analyzing the linear properties of submicrometer optical waveguide structures.

Paper Details

Date Published: 1 October 2007
PDF: 7 pages
Opt. Eng. 46(10) 104602 doi: 10.1117/1.2793711
Published in: Optical Engineering Volume 46, Issue 10
Show Author Affiliations
David Duchense, Institut National de la Recherche Scientifique (Canada)
Pavel Cheben, National Research Council Canada (Canada)
Roberto A. Morandotti, Institut National de la Recherche Scientifique (Canada)
Boris Lamontagne, National Research Council Canada (Canada)
Dan-Xia Xu, National Research Council Canada (Canada)
Siegfried Janz, National Research Council Canada (Canada)
Demetrios N. Christodoulides, College of Optics & Photonics/Univ. of Central Florida (United States)

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