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Journal of Electronic Imaging

Automated algorithm for the identification of artifacts in mottled and noisy images
Author(s): Onome Augustine Ugbeme; Eli Saber; Wencheng Wu; Kartheek Chandu
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Paper Abstract

We describe a method for automatically classifying image-quality defects on printed documents. The proposed approach accepts a scanned image where the defect has been localized a priori and performs several appropriate image processing steps to reveal the region of interest. A mask is then created from the exposed region to identify bright outliers. Morphological reconstruction techniques are then applied to emphasize relevant local attributes. The classification of the defects is accomplished via a customized tree classifier that utilizes size or shape attributes at corresponding nodes to yield appropriate binary decisions. Applications of this process include automated/assisted diagnosis and repair of printers/copiers in the field in a timely fashion. The proposed technique was tested on a database of 276 images of synthetic and real-life defects with 94.95% accuracy.

Paper Details

Date Published: 1 July 2007
PDF: 11 pages
J. Electron. Imag. 16(3) 033015 doi: 10.1117/1.2761920
Published in: Journal of Electronic Imaging Volume 16, Issue 3
Show Author Affiliations
Onome Augustine Ugbeme, Rochester Institute of Technology (United States)
Eli Saber, Rochester Institute of Technology (United States)
Wencheng Wu, Xerox Corp. (United States)
Kartheek Chandu, Rochester Institute of Technology (United States)

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