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Optical Engineering

Subnanometer displacement measurement by averaging of phase difference in windowed digital holographic interferometry
Author(s): Yoshiharu Morimoto; Matui Toru; Motoharu Fujigaki; Norikazu Kawagishi
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Paper Details

Date Published: 1 February 2007
PDF: 8 pages
Opt. Eng. 46(2) 025603 doi: 10.1117/1.2538709
Published in: Optical Engineering Volume 46, Issue 2
Show Author Affiliations
Yoshiharu Morimoto, Wakayama Univ. (Japan)
Matui Toru, Wakayama Univ. (Japan)
Motoharu Fujigaki
Norikazu Kawagishi

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