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Optical Engineering • Open Access

Full-field phase measurement by wavelength-tuning interferometry in the C-band

Paper Abstract

Fluctuations in the output intensity and wavelength of an external cavity diode laser can introduce significant error to wavelength-tuned interferometric measurement. However, a robust phase-retrieval algorithm can compensate for these nonlinearities. Employing an inexpensive phosphor-coated charge-coupled device camera sensitive to C-band infrared, full-field interferometric phase retrieval utilizing wavelength tuning of a 1555 nm external cavity diode laser is reported. Phase measurement of a tilted mirror is presented with an estimated accuracy within 7 nm.

Paper Details

Date Published: 1 December 2006
PDF: 3 pages
Opt. Eng. 45(12) 120504 doi: 10.1117/1.2401169
Published in: Optical Engineering Volume 45, Issue 12
Show Author Affiliations
Patrick Egan, Univ. of Limerick (Ireland)
Fereyduon Lakestani, Joint Research Ctr. (Italy)
Maurice Patrick Whelan, Joint Research Ctr. (Italy)
Michael J. Connelly, Univ. of Limerick (Ireland)


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