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Journal of Biomedical Optics

Comparison between a time-domain and a frequency-domain system for optical tomography
Author(s): Ilkka T. Nissilä; Jeremy C. Hebden; David Jennions; Jenni Heino; Martin Schweiger; Kalle M. Kotilahti; Tommi E.J. Noponen; Adam P. Gibson; S. Jaervenpaeae; Lauri Lipiäinen; Toivo E. Katila
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Paper Abstract

The quality of phase and amplitude data from two medical optical tomography systems were compared. The two systems are a 32-channel time-domain system developed at University College London (UCL) and a 16-channel frequency-domain system developed at Helsinki University of Technology (HUT). Difference data measured from an inhomogeneous and a homogeneous phantom were compared with a finite-element method (diffusion equation) and images of scattering and absorption were reconstructed based on it. The measurements were performed at measurement times between 1 and 30 s per source. The mean rms errors in the data measured by the HUT system were 3.4% for amplitude and 0.51 deg for phase, while the corresponding values for the UCL data were 6.0% and 0.46 deg, respectively. The reproducibility of the data measured with the two systems was tested with a measurement time of 5 s per source. It was 0.4% in amplitude for the HUT system and 4% for the UCL system, and 0.08 deg in phase for both systems. The image quality of the reconstructions from the data measured with the two systems were compared with several quantitative criteria. In general a higher contrast was observed in the images calculated from the HUT data.

Paper Details

Date Published: 1 November 2006
PDF: 18 pages
J. Biomed. Opt. 11(6) 064015 doi: 10.1117/1.2400700
Published in: Journal of Biomedical Optics Volume 11, Issue 6
Show Author Affiliations
Ilkka T. Nissilä, Helsinki Univ. of Technology (Finland)
Jeremy C. Hebden, Univ. College London (United Kingdom)
David Jennions, Univ. College London (United Kingdom)
Jenni Heino, Univ. of Helsinki (Finland)
Martin Schweiger, Univ. College London (United Kingdom)
Kalle M. Kotilahti, Helsinki Univ. of Technology (Finland)
Tommi E.J. Noponen, Helsinki Univ. of Technology (Finland)
Adam P. Gibson, Univ. College London (United Kingdom)
S. Jaervenpaeae, Univ. of Helsinki (Finland)
Lauri Lipiäinen, Helsinki Univ. of Technology (Finland)
Toivo E. Katila, Helsinki Univ. of Technology (Finland)

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