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Journal of Electronic Imaging

Edge-dependent interpolation-based deinterlacing using edge patterns
Author(s): Min Kyu Park; Min Byun; Jong Hyun Park; Moon Gi Kang
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Paper Abstract

A deinterlacing algorithm based on edge-dependent interpolation (EDI) that considers edge patterns is proposed. Generally, EDI algorithms perform visually better than other deinterlacing algorithms using one field. However, they produce unpleasant results due to failure in estimating edge direction. To estimate the edge direction precisely, not only simple differences between adjacent two lines but also edge patterns are used. Edge patterns, which give sufficient information to estimate the edge direction, appear along the edge direction. Therefore, we analyze properties of edge patterns and model them as a weight function. The weight function helps the proposed method to estimate the edge direction precisely. Experimental results indicate that the proposed algorithm outperforms conventional EDI approaches with respect to both objective and subjective criteria.

Paper Details

Date Published: 1 October 2006
PDF: 8 pages
J. Electron. Imag. 15(4) 043003 doi: 10.1117/1.2360696
Published in: Journal of Electronic Imaging Volume 15, Issue 4
Show Author Affiliations
Min Kyu Park, Yonsei Univ. (South Korea)
Min Byun, SAMSUNG Electronics Co., Ltd. (South Korea)
Jong Hyun Park, Yonsei Univ. (South Korea)
Moon Gi Kang, Yonsei Univ. (South Korea)

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