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Optical Engineering

Measurement of refractive indices of 20 optical materials at low temperatures
Author(s): Tomoyasu Yamamuro; Shuji Sato; Takahiro Zenno; Norihide Takeyama; Hideo Matsuhara; Ippei Maeda; Yoshio Matsueda
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Paper Abstract

We build a refractometer capable of measuring refractive indices at low temperatures from visible to near-infrared wavelength. Refractive indices of 20 optical materials (three fluorides, 15 glasses, fused silica, and KRS-5) are measured at wavelengths of 365.0, 435.8, 546.1, 1014.0, 1529.6, 2122, and 3298 nm at temperatures of ~80, 120, 180, 240, and 293 K. The temperature dependences of the refractive indices are shown in a table and figures.

Paper Details

Date Published: 1 August 2006
PDF: 12 pages
Opt. Eng. 45(8) 083401 doi: 10.1117/1.2336241
Published in: Optical Engineering Volume 45, Issue 8
Show Author Affiliations
Tomoyasu Yamamuro, Genesia Corp. (Japan)
Shuji Sato, Nagoya Univ. (Japan)
Takahiro Zenno, Nagoya Univ. (Japan)
Norihide Takeyama, Genesia Corp. (Japan)
Hideo Matsuhara, Japan Aerospace Exploration Agency (Japan)
Ippei Maeda, Tokyo Metropolitan Institute of Technology (Japan)
Yoshio Matsueda, Shimadzu Device Corp. (Japan)


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