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Optical Engineering • Open Access

Refractive index dispersion measurement of absorbing layers from transmittance spectra

Paper Abstract

We describe a fast and accurate method for the measurement of refractive index spectra of absorbing layers from transmittance spectra at two angles of incidence. The method is less sensitive to surface conditions than other photometric techniques.

Paper Details

Date Published: 1 June 2006
PDF: 2 pages
Opt. Eng. 45(6) 060504 doi: 10.1117/1.2208560
Published in: Optical Engineering Volume 45, Issue 6
Show Author Affiliations
Celia A. Sanchez-Perez, Univ. Nacional Autonoma de Mexico (Mexico)
Augusto García-Valenzuela, Univ. Nacional Autónoma de México (Mexico)

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