Share Email Print
cover

Optical Engineering

Automated three-axis gonioreflectometer for computer graphics applications
Author(s): Hongsong Li; Sing-Choong Foo; Kenneth E. Torrance; Stephen H. Westin
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We describe an automated three-axis gonioreflectometer, which can help increase the physical realism of computer graphics renderings by providing light scattering data for the surfaces in a scene. The gonioreflectometer performs rapid measurements of the bidirectional reflectance distribution function (BRDF) for flat, isotropic, sample surfaces over the complete visible spectrum and over most of the incident and reflection hemispheres. The instrument employs a broadband light source and a detector with a diffraction grating and linear diode array. Validation is achieved by comparisons against reference surfaces and other instruments. The accuracy and spectral and angular ranges of the BRDFs are appropriate for computer graphics imagery, while reciprocity and energy conservation are preserved. Measured BRDFs on rough aluminum, metallic silver paint, and a glossy yellow paint are reported, and an example rendered automotive image is included.

Paper Details

Date Published: 1 April 2006
PDF: 11 pages
Opt. Eng. 45(4) 043605 doi: 10.1117/1.2192787
Published in: Optical Engineering Volume 45, Issue 4
Show Author Affiliations
Hongsong Li, Cornell Univ. (United States)
Sing-Choong Foo, Sony Pictures Imageworks, Inc. (United States)
Kenneth E. Torrance, Cornell Univ. (United States)
Stephen H. Westin, Cornell Univ. (United States)


© SPIE. Terms of Use
Back to Top