Share Email Print

Optical Engineering

Gas phase chemical analysis using long-wavelength vertical-cavity surface-emitting lasers
Author(s): Alexandre P. Lytkine; Wolfgang Jäger; John Tulip
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A method of gas phase chemical analysis using direct absorption spectroscopy is implemented with long-wavelength vertical-cavity surface-emitting lasers (VCSELs) operating near 1577 nm. The method is based on a linear dependence of widths of collisionally broadened absorption lines on gas pressure. It is shown that the absolute gas concentrations in multicomponent gas mixtures can be extracted from the line widths of all compounds measured simultaneously. The concentrations of both absorbing and nonabsorbing compounds are extracted from the results of simultaneous measurements of peak absorption and line width of the absorbing compound. Long-wavelength VCSELs with a buried tunnel junction (Vertilas, Germany) are used, for the first time, for multispecies and trace gas detection. Continuous single-mode tuning of the VCSELs up to 30 cm–1 is achieved with temperature and injection current varied in the range 0 to 50 °C and 1.3 to 6.5 mA, respectively. A fractional absorption of ~10–4 (600 ppm of CO2 in air) is measured with a single-beam spectroscope. The method described can be used for laser chemical analysis of gas mixtures with relatively high concentrations of target compounds and for open-path trace gas sensing. Compact sensors based on long-wavelength VCSELs can be developed for environmental and industrial gas monitoring.

Paper Details

Date Published: 1 April 2006
PDF: 8 pages
Opt. Eng. 45(4) 044301 doi: 10.1117/1.2190662
Published in: Optical Engineering Volume 45, Issue 4
Show Author Affiliations
Alexandre P. Lytkine, Univ. of Alberta (Canada)
Wolfgang Jäger, Univ. of Alberta (Canada)
John Tulip, Univ. of Alberta (Canada)

© SPIE. Terms of Use
Back to Top