Share Email Print

Optical Engineering

Improved techniques for measuring x-ray mass attenuation coefficients
Author(s): Martin D. de Jonge; Chanh Q. Tran; Christopher T. Chantler; Zwi N. M .N. Barnea
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We apply the x-ray extended-range technique (XERT) to measure mass attenuation coefficients over one order of magnitude more accurately than previously reported in the literature. We describe the application of the XERT to the investigation of systematic effects due to harmonic energy components in the x-ray beam, scattering and fluorescence from the absorbing sample, the bandwidth of the x-ray beam, and thickness variations across the absorber. The high-accuracy measurements are used for comparison with different calculations of mass attenuation coefficients, and to identify particular regions where these calculations fail.

Paper Details

Date Published: 1 April 2006
PDF: 8 pages
Opt. Eng. 45(4) 046501 doi: 10.1117/1.2190647
Published in: Optical Engineering Volume 45, Issue 4
Show Author Affiliations
Martin D. de Jonge, Argonne National Lab. (United States)
Chanh Q. Tran, The Univ. of Melbourne (Australia)
Christopher T. Chantler, The Univ. of Melbourne (Australia)
Zwi N. M .N. Barnea, The Univ. of Melbourne (Australia)

© SPIE. Terms of Use
Back to Top