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Optical Engineering

Optical characterization of Ag–Sb–Te chalcogenide thin films
Author(s): Yagyadeva D. Sharma; Promod K. Bhatnagar
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Paper Abstract

A systematic investigation of AgxSb2(1–x)Te3(1–x) (x=0.16, 0.18, and 0.20) is reported. The optical properties of the material were studied using a UV spectrophotometer. The optical behavior of a material is generally utilized to determine its optical constants such as reflectance, transmittance, and optical band gap E0. The value of E0 is estimated for these samples by measuring the absorption coefficient as a function of the wavelength of light in the range 300 to 1400 nm. Films of different Ag content were studied both before and after annealing. It was concluded that this material is a candidate for phase change optical memory.

Paper Details

Date Published: 1 March 2006
PDF: 7 pages
Opt. Eng. 45(3) 033801 doi: 10.1117/1.2181586
Published in: Optical Engineering Volume 45, Issue 3
Show Author Affiliations
Yagyadeva D. Sharma, Osaka Univ. (Japan)
Promod K. Bhatnagar, Univ. of Delhi (India)


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