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Optical Engineering

Optical thickness and anisotropic orientation of a birefringent thin film: analysis from explicit expressions for reflection and transmission coefficients
Author(s): Yi-Jun Jen; Cheng-Lung Chiang
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Paper Abstract

We present explicit expressions for the reflection and transmission coefficients of an anisotropic thin film. In the general case, the optical axis and the incident ray are in arbitrary directions. Multireflected ordinary rays and extraordinary rays in the thin film are coupled to each other at the interface. The degrees of polarization conversion for reflected and transmitted light from the anisotropic thin film are calculated. The transmittance and reflectance are measured by rotating the polarization of the normal incident ray, and the columnar growth plane and film thickness are thus determined.

Paper Details

Date Published: 1 February 2006
PDF: 6 pages
Opt. Eng. 45(2) 023802 doi: 10.1117/1.2173673
Published in: Optical Engineering Volume 45, Issue 2
Show Author Affiliations
Yi-Jun Jen, National Taipei Univ. of Technology (Taiwan)
Cheng-Lung Chiang, National Taipei Univ. of Technology (Taiwan)

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