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Optical Engineering

Comparison of Kretschmann-Raether configuration angular and thickness regimes with phase-difference shift for measuring changes in refractive index
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Paper Abstract

We derive the phase difference equation between the p- and s-polarizations of reflection light based on the Kretschmann-Raether configuration. This phase difference equation is used to examine the relationship of the incident angle and metal film thickness versus the phase differences under a small refractive index variation. For a fixed incident angle, the phase difference has a higher measurement sensitivity than the reflectivity change. At the critical angle, there is a higher sensitivity when the metal film thickness is smaller than the skin depth. The surface plasmon resonant (SPR) angle dominates when the metal film thickness is greater than the skin depth. The phase measuring sensitivity at the SPR angle is higher than that at the critical angle by 1 order.

Paper Details

Date Published: 1 February 2006
PDF: 5 pages
Opt. Eng. 45(2) 023803 doi: 10.1117/1.2172346
Published in: Optical Engineering Volume 45, Issue 2
Show Author Affiliations
Kun-Huang Chen, Feng Chia Univ. (Taiwan)
Jing-Heng Chen, National Chiao Tung Univ. (Taiwan)
Jiun-You Lin, National Changhua Univ. of Education (Taiwan)


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