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Optical Engineering

Wavelet-aided spatial carrier fringe pattern analysis for 3-D shape measurement
Author(s): Jian Zhou
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Paper Abstract

The latest time-frequency tool, wavelet analysis, is presented to extract the phase information φ(x,y) from a single spatial carrier fringe pattern. First, the fringe pattern is generated and projected onto an object. The spatial carrier fringe pattern, carrying the 3-D shape of the object, is then captured using a CCD camera. Afterward, the spatial carrier fringe pattern is modulated by two high-frequency waves, which makes the spectrum of the carried phase relatively lower among the spectra of two modulated patterns. Following this, the spectrum of the object is separated into the approximation subband using a wavelet transform. The phase map of the 3-D shape of the object is then extracted from the mixed spectra by reconstructing only the approximation of their wavelet transforms. Finally, the 3-D shape of the object can be calculated from the phase map.

Paper Details

Date Published: 1 November 2005
PDF: 8 pages
Opt. Eng. 44(11) 113602 doi: 10.1117/1.2127887
Published in: Optical Engineering Volume 44, Issue 11
Show Author Affiliations
Jian Zhou, Sensitron Semiconductor (United States)


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