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Optical Engineering

Characterization of digital-micromirror device-based infrared scene projector
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Paper Abstract

A test procedure is developed for an infrared laser scene projector, and applied to a projection system that we develop based on digital micromirror technology. The intended use will be for simulation and target training. Resolution and noise are significant parameters for target perception models of infrared imaging systems. System resolution is normally measured as the modulation transfer function (MTF), and its noise modeled through an appropriate signal standard deviation metric. We compare MTF measurements for both mid-wave (MWIR) and long-wave IR (LWIR) bands for an infrared laser scene projector based on the digital micromirror device (DMD). Moreover, we use two complimentary models to characterize imaging camera noise. This provides a quantitative image-quality criterion of system performance.

Paper Details

Date Published: 1 August 2005
PDF: 7 pages
Opt. Eng. 44(8) 086402 doi: 10.1117/1.2013249
Published in: Optical Engineering Volume 44, Issue 8
Show Author Affiliations
William Ray Folks, College of Optics and Photonics/Univ. of Central Florida (United States)
José Manuel López-Alonso, Univ. Complutense de Madrid (Spain)
Brian Monacelli, College of Optics and Photonics/Univ. of Central Florida (United States)
Arthur Robert Weeks, College of Optics and Photonics/Univ. of Central Florida (United States)
Guy Zummo, College of Optics and Photonics/Univ. of Central Florida (United States)
Daniel Mullaly, Univ. of Central Florida (United States)
Glenn David Boreman, College of Optics and Photonics/Univ. of Central Florida (United States)


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