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Optical Engineering

Two-wavelength lateral shearing interferometry
Author(s): Dalip Singh Mehta; Priti Singh; Mohd Shoeb Faridi; Saba Mirza; Chandra Shakher
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Paper Abstract

We propose a two-wavelength interferometric system based on a single optical element, i.e., a shear plate. The observation of beat formation phenomenon and the measurement of phase at synthetic wavelength are demonstrated for the first time using two wavelengths simultaneously in a lateral shearing interferometer. Shearing interferograms are recorded both at individual wavelength and at synthetic wavelength. The phase map at synthetic wavelength is obtained by means of subtracting the phase maps at individual wavelength as well as directly from the synthetic interferogram, and the results are found in good agreement. The validity of the principle is applied for collimation testing and reconstructing the phase map of transparent objects. The main advantages of the present system over the previous systems based on two-wavelength interferometry are high stability, nearly common path interferometry, single optical element (shear plate) requirement, compactness, and low cost.

Paper Details

Date Published: 1 August 2005
PDF: 7 pages
Opt. Eng. 44(8) 085603 doi: 10.1117/1.2012498
Published in: Optical Engineering Volume 44, Issue 8
Show Author Affiliations
Dalip Singh Mehta, Indian Institute of Technology Delhi (India)
Priti Singh, Indian Institute of Technology Delhi (India)
Mohd Shoeb Faridi, Indian Institute of Technology Delhi (India)
Saba Mirza, Indian Institute of Technology Delhi (India)
Chandra Shakher, Indian Institute of Technology Delhi (India)

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