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Optical Engineering • Open Access

Efficient Fourier shape descriptor for industrial defect images using wavelets

Paper Abstract

The use of image retrieval and classification has several applications in industrial imaging systems, which typically use large image archives. In these applications, the matter of computational efficiency is essential and therefore compact visual descriptors are necessary to describe image content. A novel approach to contour-based shape description using wavelet transform combined with Fourier transform is presented. The proposed method outperforms ordinary Fourier descriptors in the retrieval of complicated industrial shapes without increasing descriptor dimensionality.

Paper Details

Date Published: 1 August 2005
PDF: 3 pages
Opt. Eng. 44(8) 080503 doi: 10.1117/1.1993687
Published in: Optical Engineering Volume 44, Issue 8
Show Author Affiliations
Iivari Kunttu, Tampere Univ. of Technology (Finland)
Leena Lepistö, Tampereen Teknillinen Yliopisto (Finland)
Ari J.E. Visa, Tampereen Teknillinen Yliopisto (Finland)

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