Share Email Print

Journal of Electronic Imaging

Spectral reflection and dot surface prediction models for color halftone prints
Author(s): Roger David Hersch; Patrick Emmel; Fabien Collaud; Frederique Crete
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Abstract

The proposed new spectral reflection model enhances the classical Clapper-Yule model by taking into account the fact that proportionally more incident light through a given colorant surface is reflected back onto the same colorant surface than onto other colorant surfaces. It comprises a weighted mean between a component specifying the part of the incident light that exits through the same colorant as the colorant from which it enters (Saunderson corrected Neugebauer component) and a component specifying the part of the incident light whose emerging light components exit from all colorants (Clapper-Yule component). We also propose models for taking into account ink spreading, a phenomenon that occurs when printing an ink halftone in superposition with one or several solid inks. The ink-spreading model incorporates nominal-to-effective surface coverage functions for each of the different ink superposition conditions. A system of equations yields the effective ink surface coverages of a color halftone as a weighted mean of the ink surface coverages specific to the different superposition conditions. The new spectral reflection prediction model combined with the ink-spreading model yields excellent spectral reflection predictions for clustered-dot color halftones printed on an offset press or on thermal transfer printers.

Paper Details

Date Published: 1 July 2005
PDF: 12 pages
J. Electron. Imaging. 14(3) 033001 doi: 10.1117/1.1989987
Published in: Journal of Electronic Imaging Volume 14, Issue 3
Show Author Affiliations
Roger David Hersch, École Polytechnique Fédérale de Lausanne (Switzerland)
Patrick Emmel, Clariant International (Switzerland)
Fabien Collaud, École Polytechnique Fédérale de Lausanne (Switzerland)
Frederique Crete, STMicroelectronics (France)

© SPIE. Terms of Use
Back to Top