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Optical Engineering

Highly robust watermarking scheme based on surrounding mean value relationship
Author(s): Jieh-Ming Shieh; Der-Chyuan Lou; Ming-Chang Chang
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Paper Details

Date Published: 1 June 2005
PDF: 11 pages
Opt. Eng. 44(6) 067006 doi: 10.1117/1.1929667
Published in: Optical Engineering Volume 44, Issue 6
Show Author Affiliations
Jieh-Ming Shieh, Chung Hwa College of Medical Technology (Taiwan)
Der-Chyuan Lou, National Defense Univ. (Taiwan)
Ming-Chang Chang, National Defense Univ. (Taiwan)

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