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Optical Engineering

Alternative method for measuring both the refractive indices and the thickness of silver-halide holographic plates
Author(s): Cheng-Chih Hsu; Jiun-You Lin; Kun-Huang Chen; Der-Chin Su
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Paper Abstract

First, the phase differences between s- and p-polarizations of a circularly polarized heterodyne light beam reflected from the emulsion layer, and that from its substrate, are measured, respectively. The measured data are substituted into specially derived equations, so the refractive indices of the emulsion layer and its substrate can be calculated. Second, the variations of phase differences between s- and p-polarizations due to the wavelength shifts and the extraction of the holographic plate in a modified Michelson interferometer are measured. Then, the thickness of the emulsion layer and its substrate can be estimated based on the measured values of refractive indices, the wavelength shifts, and the phase difference variations. This method has some advantages, such as high resolution and easy operation in only one optical configuration.

Paper Details

Date Published: 1 May 2005
PDF: 6 pages
Opt. Eng. 44(5) 055801 doi: 10.1117/1.1902624
Published in: Optical Engineering Volume 44, Issue 5
Show Author Affiliations
Cheng-Chih Hsu, Industrial Technology Research Institute (Taiwan)
Jiun-You Lin, National Changhua Univ. of Education (Taiwan)
Kun-Huang Chen, Feng Chia Univ. (Taiwan)
Der-Chin Su, National Chiao Tung Univ. (Taiwan)


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