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Optical Engineering

Optical characterization of a homogenous photosensitive layer by thin film resonance method
Author(s): Lhassan Elouad; Idriss El-Hafidi; Romualda Grzymala; Patrick P. Meyrueis
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Paper Abstract

Polypeptide material layers can be used for different optical applications as diffractive optical elements or diffractive storage memory. The optical parameters of the polypeptide layers must be precisely known before implementing these applications. These optical parameters are the layer thickness, layer refractive index, and layer substrate refractive index. Thin film resonance (TFR) is one of the most adapted methods to evaluate the refractive index and the thickness of a homogenous photosensitive polypeptide layer. We restrict our method to transparent films layered on a transparent substrate. The proposed method is more convenient for layers having thicknesses greater than a few microns. The photosensitive material we consider is a polypeptide layer with thickness greater than 10 µm. The measurement of these optical parameters are provided separately. A low absorption of this layer is considered. We validate the possibility of easily measuring these parameters. The excellent agreement between the calculated and measured data confirms the practical efficiency of this method. This method is applied as an example to two standard holographic emulsions PFG-04 and PFG-03M for validation. After these tests, the method is applied to characterize the coated polypeptide layer elaborated in our laboratory. We analyze the measurements performed with our proposed method on four polypeptide layers prepared with different added quantities of doping agents. The main interest of our method is to allow the measurement of the layer and substrate refractive indexes (even when they are close) jointly with the layer thickness measurement just by using a simple setup based on monochromatic light as a source and an angular scanning.

Paper Details

Date Published: 1 March 2005
PDF: 6 pages
Opt. Eng. 44(3) 033801 doi: 10.1117/1.1839888
Published in: Optical Engineering Volume 44, Issue 3
Show Author Affiliations
Lhassan Elouad, Univ. Louis Pasteur (France)
Idriss El-Hafidi, Univ. Louis Pasteur (France)
Romualda Grzymala, Univ. Louis Pasteur (France)
Patrick P. Meyrueis, Univ. Louis Pasteur (France)

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