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Optical Engineering

Measurement of ion-exchanged waveguide burial depth with a camera
Author(s): Jesse A. Frantz; James Carriere; Raymond K. Kostuk
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Paper Abstract

We present a novel method of measuring the depth of a mode for a buried ion-exchanged channel waveguide in glass while simultaneously measuring its near-field mode profile. The method is simple to implement and can be used without removing the sample from a standard waveguide characterization system. Experimental results for surface and buried Ag+/Na+ exchanged waveguides are presented. It is demonstrated that the depth of a mode can be determined with an uncertainty of ±0.2 µm.

Paper Details

Date Published: 1 December 2004
PDF: 6 pages
Opt. Eng. 43(12) doi: 10.1117/1.1814364
Published in: Optical Engineering Volume 43, Issue 12
Show Author Affiliations
Jesse A. Frantz, The Univ. of Arizona (United States)
James Carriere, The Univ. of Arizona (United States)
Raymond K. Kostuk, The Univ. of Arizona (United States)

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