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Optical Engineering

Study on the internal reflection of the multimode-interference-type device
Author(s): Lin Yang; Yuliang Liu; Qiming Wang
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Paper Abstract

The internal reflection of the multimode-interference (MMI)-type device is calculated with the bidirectional beam propagation method. The calculated results indicate that the difference of the effective refractive indices between the core region and the surrounding region has a determining effect on the internal reflection of the MMI-type device. The output taper for the MMI-type combiner and splitter has a more evident effect on the internal reflection than the input taper. The internal reflection decreases with increasing the end width of the taper. For the MMI-type device with appropriate tapers, the internal reflection does not show evident degradation with the deviation of the length of the MMI region from its optimal value.

Paper Details

Date Published: 1 October 2004
PDF: 5 pages
Opt. Eng. 43(10) doi: 10.1117/1.1789987
Published in: Optical Engineering Volume 43, Issue 10
Show Author Affiliations
Lin Yang, Institute of Semiconductors (China)
Yuliang Liu, Institute of Semiconductors (China)
Qiming Wang, Institute of Semiconductors (China)

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