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Optical Engineering

High-resolution and easily implemented spectral measured system used for optical characterization of optoelectronic materials and devices
Author(s): Ching-Hwa Ho; Horng-Wen Lee
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Paper Abstract

We set up a compact high-resolution linear charge-coupled-device (CCD)-based spectrometer for the characterization of optoelectronic materials and devices. The spectrometer is controlled by a personal computer. Detailed design diagrams of the mechanical structure and electronic hardware are described. Spectral resolution of the CCD measurement system of ~0.7 Å/pixel is determined from spectral calibration using two laser sources. Electroluminescent measurements of several selective optoelectronic components, as well as the transmission measurements of GaSe and GaSe0.9S0.1 layered semiconductors, are performed utilizing the new spectrometer. The experimental results are analyzed and discussed.

Paper Details

Date Published: 1 July 2004
PDF: 6 pages
Opt. Eng. 43(7) doi: 10.1117/1.1755718
Published in: Optical Engineering Volume 43, Issue 7
Show Author Affiliations
Ching-Hwa Ho, National Dong Hwa Univ. (Taiwan)
Horng-Wen Lee, National Dong Hwa Univ. (Taiwan)


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