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Optical Engineering

Geometrical superresolution in infrared sensor: experimental verification
Author(s): Zeev Zalevsky; Noam Shamir; David Mendlovic
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Paper Abstract

The resolution of many imaging systems is often restricted by the limited spatial resolution of its sensing device rather than by diffraction limits related to the optical system. This spatial resolution of the sensor, when limited by the pixels' dimensions, is coined as "geometrical resolution." Earlier, we suggested a technique for overcoming this limit, thus obtaining "geometrical superresolution." The proposed approach is based on capturing a set of images after attaching special predesigned mask to the detector plane, interlacing the pixels of the captured images, and eventually applying inverse filtering over the interlaced image. Experimental results are presented to demonstrate the ability of the suggested technique.

Paper Details

Date Published: 1 June 2004
PDF: 6 pages
Opt. Eng. 43(6) doi: 10.1117/1.1737372
Published in: Optical Engineering Volume 43, Issue 6
Show Author Affiliations
Zeev Zalevsky, Tel-Aviv University (Israel)
Noam Shamir, Tel-Aviv Univ. (Israel)
David Mendlovic, Tel-Aviv Univ. (Israel)


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