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Optical Engineering

Method of characterization of effective shrinkage in reflection holograms
Author(s): Pavel V Trochtchanovitch; Nikolai A. Kostrov; Emin H. Goulanian; Faouzi Zerrouk; Eugene F. Pen; Vladimir V. Shelkovnikov
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Paper Abstract

A method is described to evaluate plane-wave volume hologram fringe inclination and spacing, as well as the recording material average refraction index. This evaluation allows us to estimate changes in the hologram parameters due to recording material shrinkage. The method is based on measurements of the incident and diffracted beam Bragg angles for two different wavelengths. The conditions for minimizing measurement errors are obtained. The experimental data are in good agreement with the calculated data.

Paper Details

Date Published: 1 May 2004
PDF: 9 pages
Opt. Eng. 43(5) doi: 10.1117/1.1666743
Published in: Optical Engineering Volume 43, Issue 5
Show Author Affiliations
Pavel V Trochtchanovitch, Zecotek Innovations Incorporated (Canada)
Nikolai A. Kostrov, Zecotek Innovations Inc. (Canada)
Emin H. Goulanian, UTAR Scientific Inc. (Canada)
Faouzi Zerrouk, Unified Technologies Advanced Research Inc. (Canada)
Eugene F. Pen, Institute of Automation and Electrometry (Russia)
Vladimir V. Shelkovnikov, Novosibirsk Institute of Organic Chemistry (Russia)


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