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Optical Engineering

Grazing angle enhanced backscattering from a dielectric film on a reflecting metal substrate
Author(s): Zu-Han Gu; Iosif M. Fuks; Mikael Ciftan
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Paper Abstract

We have recently observed several features from a randomly rough dielectric film on a reflecting metal substrate including a change in the spectrum of light at the satellite peaks, the high-order correlation, and enhanced backscattering from the grazing angle. In this paper, we focus on the enhanced backscattering phenomena. The backscattering signal at small grazing angles is very important for vehicle re-entrance and subsurface radar sensing applications. Recently, we performed an experimental study of far-field scattering at small grazing angles, especially enhanced backscattering at grazing angles. For a randomly weak, rough dielectric film on a reflecting metal substrate, a much larger enhanced backscattering peak is measured. Experimental results are compared with theoretical predictions based on a two-scale surface roughness scattering model.

Paper Details

Date Published: 1 March 2004
PDF: 9 pages
Opt. Eng. 43(3) doi: 10.1117/1.1646410
Published in: Optical Engineering Volume 43, Issue 3
Show Author Affiliations
Zu-Han Gu, Surface Optics Corp. (United States)
Iosif M. Fuks, Zel Technologies (United States)
Mikael Ciftan, U.S. Army Research Office (United States)

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