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Optical Engineering

Robust template-matching measurements for variations of signal amplitude
Author(s): Munho Ryu; Jong Dae Kim; Byoung Woon Min
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Paper Details

Date Published: 1 February 2004
PDF: 7 pages
Opt. Eng. 43(2) doi: 10.1117/1.1634294
Published in: Optical Engineering Volume 43, Issue 2
Show Author Affiliations
Munho Ryu, Seoul National Univ. (South Korea)
Jong Dae Kim, Hallym Univ. (South Korea)
Byoung Woon Min, Univ. of Texas/Austin (United States)


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