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Journal of Electronic Imaging

Compound document compression with model-based biased reconstruction
Author(s): Edmund Yin-Mun Lam
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Paper Details

Date Published: 1 January 2004
PDF: 7 pages
J. Electron. Imag. 13(1) doi: 10.1117/1.1631317
Published in: Journal of Electronic Imaging Volume 13, Issue 1
Show Author Affiliations
Edmund Yin-Mun Lam, Univ. of Hong Kong (Hong Kong China)


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