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Optical Engineering

High speed three-dimensional profilometry utilizing laser diode arrays
Author(s): Ming Chang; Wei-Che Chang; Kao-Hui Lin
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Paper Abstract

A laser diode array probe design concept utilizing an optical scanning technique for high-speed and high-precision 3-D profile measurement is presented. The probe consists of 100 laser lines emerging from 100 laser diodes, arranged in five rows. This measurement method adopts the idea of a fringe projection technique. A profile is obtained by projecting multiple laser beams simultaneously onto the surface or using single-beam scans on the surface. The specimen profile data are obtained without the need for a scanning mechanism. The beams projected onto the surface could cause distinguishing difficulties for a complicated profile. This problem was resolved using a computer to control the on/off sequences for the diode array light source. The measurement accuracy is equivalent to the conventional single laser beam scanning measurement system. The measurement speed depends on the optical scanning process and usually occurs in less than 1 s when multibeam scanning is used.

Paper Details

Date Published: 1 December 2003
PDF: 5 pages
Opt. Eng. 42(12) doi: 10.1117/1.1621408
Published in: Optical Engineering Volume 42, Issue 12
Show Author Affiliations
Ming Chang, Chung Yuan Christian Univ. (Taiwan)
Wei-Che Chang, Chung Yuan Christian Univ. (Taiwan)
Kao-Hui Lin, Chung Yuan Christian Univ. (Taiwan)

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