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Optical Engineering

Measurement of microthermal deformations in an optical pick-up base using holographic interferometry
Author(s): Yongmin Seo; Sunghoon Cho; Shinill Kang
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Paper Abstract

An experimental method is presented to measure microthermal deformation of an optical pick-up base by using holographic interferometry. Calibration tests are used to measure out-of-plane and in-plane deformations. A cantilever and a plate are deformed according to the prescribed motion, actuated by a piezoelectric transducer with 1-nm resolution, and the interferometric measurements are compared quantitatively with the analytic solution and measurements from finite element analysis (FEA). The thermal deformation of an aluminum pick-up base, manufactured from a die-casting process, are measured in actual thermal environments by using the present holographic interferometry. Finally, the experimental results obtained by using holographic interferometry are compared with those of the FEA with initial surface stress conditions obtained from x-ray diffraction measurements.

Paper Details

Date Published: 1 November 2003
PDF: 6 pages
Opt. Eng. 42(11) doi: 10.1117/1.1613277
Published in: Optical Engineering Volume 42, Issue 11
Show Author Affiliations
Yongmin Seo, Yonsei Univ. (South Korea)
Sunghoon Cho, Yonsei Univ. (South Korea)
Shinill Kang, Yonsei Univ. (South Korea)

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