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Optical Engineering

Profilometry by fringe projection
Author(s): Luis Salas; Esteban Luna; Javier Salinas; Victor M. Garcia; Manuel Servin
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Paper Abstract

We present a method to obtain profilometry of a suitable object by fringe projection. The method is appropriate to the case of large objects as compared to the distance from the illuminating source, that is, a nonconstant equivalent wavelength. We develop an experiment to laterally displace a set of fringes on a sphere and obtain quantitative results. There are several orientation parameters involved in the method, and a minimization algorithm is developed to adjust the values of some of them. A series of numerical experiments are performed on this method to test its accuracy under various circumstances. We show that the method can currently attain precisions of ≈ λeq/80 (λeq stands for equivalent wavelength) and identify possible sources of error.

Paper Details

Date Published: 1 November 2003
PDF: 8 pages
Opt. Eng. 42(11) doi: 10.1117/1.1607968
Published in: Optical Engineering Volume 42, Issue 11
Show Author Affiliations
Luis Salas, Univ. Nacional Autonoma de Mexico (United States)
Esteban Luna, Univ. Nacional Autónoma de Mexico (Mexico)
Javier Salinas, IAUNAM (United States)
Victor M. Garcia, Observatorio Astronomico Nacional (United States)
Manuel Servin, Ctr. de Investigaciones en Optica A.C. (Mexico)

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