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Optical Engineering

Phase-shifting photoelasticity using a flatbed scanner
Author(s): T. W. Ng; P.K. Quek; K.H. Lim
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Paper Abstract

We investigate the use of flatbed scanners for photoelasticity. It is found that performing phase shift on red, green, and blue component images extracted from fringe images scanned in white light can produce whole-field phase maps, though low levels of error can only be achieved using red and green component images. Results from a circular photoelastic disk subjected to direct compressive loading show close correspondence with the results from theoretical calculations. The adaptation of photoelasticity into flatbed scanners will yield systems that are simple, cost effective, and compact. These features and the demonstrated ability for automatic analysis using phase shifting should encourage a greater adoption of photoelasticity in the industry.

Paper Details

Date Published: 1 August 2003
PDF: 5 pages
Opt. Eng. 42(8) doi: 10.1117/1.1589025
Published in: Optical Engineering Volume 42, Issue 8
Show Author Affiliations
T. W. Ng, National Univ. of Singapore (Singapore)
P.K. Quek, Singapore Epson Industrial Pte. Ltd. (Singapore)
K.H. Lim, AMP Manufacturing Pte. Ltd. (Singapore)

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