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Optical Engineering

Measurement of low differential group delay and fiber birefringence
Author(s): Jabulani Dhliwayo; Aiyu Zhang; Rahim Nathoo
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Paper Abstract

We describe the measurement of low differential group delay and fiber birefringence using a commercial polarization analyzer based on a free-space rotating quarter waveplate polarimeter. Stress-induced birefringence is isolated from the 60-cm fiber under test by placing it in a suitably designed fiber chuck. A referencing scheme is used to eliminate system birefringence. The suitability of this setup for the measurement of low polarization mode dispersion (PMD) is demonstrated. We also report results that demonstrate limitations of the recently proposed Jones matrix exponential expansion for first-order PMD measurement in devices with high second-order PMD.

Paper Details

Date Published: 1 July 2003
PDF: 5 pages
Opt. Eng. 42(7) doi: 10.1117/1.1580154
Published in: Optical Engineering Volume 42, Issue 7
Show Author Affiliations
Jabulani Dhliwayo, Corning Inc. (United States)
Aiyu Zhang, Corning Inc. (United States)
Rahim Nathoo, Corning Inc. (United States)

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