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Optical Engineering

Planar pattern for automatic camera calibration
Author(s): B. Zhang; Youfu Li; Fuchao Wu
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Paper Abstract

We present a method for automatic camera calibration that requires only that a planar pattern be visible by the camera from a few (at least three) different views. A major issue is how to obtain the projection of an absolute point using the planar pattern. In the calibration, we can move either the camera or the planar pattern and no knowledge about the motion is required. We consider and resolve both linear and nonlinear parameters. In testing the proposed methods, satisfactory results are achieved in the simulation and in real data experiments.

Paper Details

Date Published: 1 June 2003
PDF: 8 pages
Opt. Eng. 42(6) doi: 10.1117/1.1574037
Published in: Optical Engineering Volume 42, Issue 6
Show Author Affiliations
B. Zhang, City Univ. of Hong Kong (Hong Kong)
Youfu Li, City Univ. of Hong Kong (Hong Kong)
Fuchao Wu, Institute of Automation (China)

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