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Optical Engineering

Fourier transform method for measurement of thin film thickness by speckle interferometry
Author(s): Canan Karaalioglu; Yani Skarlatos
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Paper Details

Date Published: 1 June 2003
PDF: 5 pages
Opt. Eng. 42(6) doi: 10.1117/1.1572498
Published in: Optical Engineering Volume 42, Issue 6
Show Author Affiliations
Canan Karaalioglu, Bogazici Univ. (Turkey)
Yani Skarlatos, Bogazici Univ. (Turkey)

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