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Optical Engineering

Noise analysis of an optically controlled metal semiconductor field effect transistor at microwave frequencies
Author(s): P. Chakrabarti; Badri Nath Tiwari; Suman Kumar
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Paper Details

Date Published: 1 February 2003
PDF: 9 pages
Opt. Eng. 42(2) doi: 10.1117/1.1532332
Published in: Optical Engineering Volume 42, Issue 2
Show Author Affiliations
P. Chakrabarti, Banaras Hindu Univ. (India)
Badri Nath Tiwari, Banaras Hindu Univ. (India)
Suman Kumar, Banaras Hindu Univ. (India)

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