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Optical Engineering

Large surface profile measurement with instantaneous phase-shifting interferometry
Author(s): N. R. Sivakumar; W. K. Hui; Krishnan Venkatakrishnan; B. K. A. Ngoi
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Paper Details

Date Published: 1 February 2003
PDF: 6 pages
Opt. Eng. 42(2) doi: 10.1117/1.1532331
Published in: Optical Engineering Volume 42, Issue 2
Show Author Affiliations
N. R. Sivakumar, Nanyang Technological Univ. (Singapore)
W. K. Hui, Nanyang Technological Univ. (Singapore)
Krishnan Venkatakrishnan, Nanyang Technological Univ. (Singapore)
B. K. A. Ngoi, Nanyang Technological Univ. (Singapore)

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