Share Email Print
cover

Optical Engineering

Large surface profile measurement with instantaneous phase-shifting interferometry
Author(s): N. R. Sivakumar; W. K. Hui; Krishnan Venkatakrishnan; B. K. A. Ngoi
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Details

Date Published: 1 February 2003
PDF: 6 pages
Opt. Eng. 42(2) doi: 10.1117/1.1532331
Published in: Optical Engineering Volume 42, Issue 2
Show Author Affiliations
N. R. Sivakumar, Nanyang Technological Univ. (Singapore)
W. K. Hui, Nanyang Technological Univ. (Singapore)
Krishnan Venkatakrishnan, Nanyang Technological Univ. (Singapore)
B. K. A. Ngoi, Nanyang Technological Univ. (Singapore)


© SPIE. Terms of Use
Back to Top