Share Email Print
cover

Optical Engineering

Evaluation of the continuous wavelet transform method for the phase measurement of electronic speckle pattern interferometry fringes
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We present an evaluation of the continuous wavelet transform method when it is used to measure the phase distribution encoded by electronic speckle pattern interferometry (ESPI) fringes. The evaluation is performed using computer-simulated fringes, an approach that allows knowing precisely the phase map contained in the pattern. It is shown that only ESPI fringes that verify the stationary phase approximation and its analytic asymptotic limit can be analyzed with the continuous wavelet transform method. The influence of the filtering process to smooth the ESPI fringes and the method used to extend the fringe pattern edges is also analyzed. Finally, additional drawbacks that emerge when this phase evaluation method is applied are discussed.

Paper Details

Date Published: 1 December 2002
PDF: 8 pages
Opt. Eng. 41(12) doi: 10.1117/1.1518032
Published in: Optical Engineering Volume 41, Issue 12
Show Author Affiliations
Alejandro Federico, Instituto Nacional de Tecnologia Industrial (Argentina)
Guillermo H. Kaufmann, Univ. Nacional de Rosario (Argentina)


© SPIE. Terms of Use
Back to Top