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Optical Engineering

High precision measurement of reflectance for films under substrates
Author(s): Xiao Tang; Jian Zheng
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Paper Abstract

A more accurate methodology to measure the reflectance of optical disks, taking into consideration the scattering losses at the surfaces of the disk, is proposed by the National Institute of Standards and Technology (NIST). The proposed method is a modification of the current standard, as described in Annex D of the Standard ECMA-267, second edition, for 120-mm DVD—Read-Only Disk (Dec. 1999, http:/ The experiment shows that the optical losses could be, in some cases, as much as 2% of the incident light power. By accounting for the losses, as in the proposed method, the accuracy of the measured reflectance is significantly improved. Thus, the primary reference disks produced with this method have a higher accuracy in reflectance measurement for the use of optical disk industry.

Paper Details

Date Published: 1 December 2002
PDF: 5 pages
Opt. Eng. 41(12) doi: 10.1117/1.1517288
Published in: Optical Engineering Volume 41, Issue 12
Show Author Affiliations
Xiao Tang, National Institute of Standards and Technology (United States)
Jian Zheng, National Institute of Standards and Technology (United States)

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