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Optical Engineering

Electric field-induced optical path change profiling using a Pohl interferometer
Author(s): Xi Yang; Lowell L. Wood; John H. Miller
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Paper Abstract

We describe an optical technique using the principles of a Pohl interferometer and divergent laser beams for measuring optical path changes in the spaces between interdigital electrodes. We present experimental results of the electric-field-induced optical path changes in an electrode space using a LiNbO3 sample.

Paper Details

Date Published: 1 November 2002
PDF: 3 pages
Opt. Eng. 41(11) doi: 10.1117/1.1512662
Published in: Optical Engineering Volume 41, Issue 11
Show Author Affiliations
Xi Yang, Univ. of Houston (United States)
Lowell L. Wood, Univ. of Houston (United States)
John H. Miller, Univ. of Houston (United States)

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