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Optical Engineering

Effective refractive index change of X-cut Z-propagation Ti:LiNbO3 waveguides by laser ablation
Author(s): Chii-Chang Chen; Vincent Armbruster; Henri Porte; Alain Carenco; Jean-Pierre Goedgebuer
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Paper Abstract

Laser ablation was applied to X-cut Z-propagation Ti:LiNbO3 waveguides. The effective refractive index change of the waveguides after the ablation was measured for both TE and TM modes. The change is more sensitive to the ablation for the TE than for the TM mode. This phenomenon was confirmed by measuring the modal effective refractive indices of a nonablated and an ablated planar Ti:LiNbO3 waveguide with the m-line method. A photoelastic effect that may cause the different effective index changes of the waveguide modes after ablation is discussed.

Paper Details

Date Published: 1 November 2002
PDF: 5 pages
Opt. Eng. 41(11) doi: 10.1117/1.1510764
Published in: Optical Engineering Volume 41, Issue 11
Show Author Affiliations
Chii-Chang Chen, Univ. de Franche Comte (Taiwan)
Vincent Armbruster, Univ. de Franche-Comte (France)
Henri Porte, Univ. de Franche-Comte (France)
Alain Carenco, France Telecom-CNET (France)
Jean-Pierre Goedgebuer, Univ. de Franche-Comte (France)

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