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Optical Engineering

Two-dimensional optical measurement techniques based on optical birefringence effects
Author(s): Yongchang Zhu; Tatsuo Takada; Yoshihiro Murooka
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Paper Abstract

Some dielectric materials become birefringent when subjected to an external force, such as an electric field or a mechanical force. For more than a decade, our research group has been engaged in developing two-dimensional optical measurement techniques for the dynamic measurement of charge distributions on a dielectric surface using the electro-optic Pockels effect, the dynamic measurement of electrical field distributions in a liquid using the electro-optic Kerr effect, and the measurement of birefringence vector distributions in plastic plates using the photoelastic effect. The system nonuniformity and the system reliability are the inevitable problems in two-dimensional measurement systems, and make two-dimensional measurements quite different from point measurements. The common image-processing techniques that have been specially developed to overcome these problems are analyzed and summarized; detailed mathematical analysis is avoided.

Paper Details

Date Published: 1 December 2002
PDF: 10 pages
Opt. Eng. 41(12) doi: 10.1117/1.1510535
Published in: Optical Engineering Volume 41, Issue 12
Show Author Affiliations
Yongchang Zhu, Sankosha Corp. (Japan)
Tatsuo Takada, Musashi Institute of Technology (Japan)
Yoshihiro Murooka, Musashi Institute of Technology (Japan)


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