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Optical Engineering

Optoelectronic refractometer characterized by high sensitivity over a wide range of refractive index
Author(s): L. M. Bali; Anchal Srivastava; Rajesh Kumar Shukla; P. Srivastava; A. Kulshreshtha; Atul Srivastava; Mahendra Kumar
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Paper Abstract

A new design for a prism-based optoelectronic refractometer proposed earlier has been investigated. Experimental results are found to be in close agreement with theoretical calculations. For a given refractive index of the prism material, the divergence of the incident conical beam and angles of the prism determine the range of refractive index of the ambient over which the refractometer remains highly sensitive. Incident conical beams of higher divergences are found to enlarge this range. This refractometer is more robust and user-friendly than other such refractometers reported in the literature. Such a device can be useful for on-line measurements of refractive indices in process control systems.

Paper Details

Date Published: 1 October 2002
PDF: 9 pages
Opt. Eng. 41(10) doi: 10.1117/1.1503073
Published in: Optical Engineering Volume 41, Issue 10
Show Author Affiliations
L. M. Bali, Lucknow Univ. (India)
Anchal Srivastava, Lucknow Univ. (India)
Rajesh Kumar Shukla, Lucknow Univ. (India)
P. Srivastava, Lucknow Univ. (India)
A. Kulshreshtha, Lucknow Univ. (India)
Atul Srivastava, Univ. of Lucknow (India)
Mahendra Kumar, Lucknow Univ. (India)

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